发明名称 |
PATTERNING METHOD USING METAL MASK, AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE COMPRISING THE SAME PATTERNING METHOD |
摘要 |
A technical idea of the present invention is to provide a patterning method using a metal mask, which can easily form a hole at a high aspect ratio, and a method for manufacturing a semiconductor device including the patterning method. The patterning method comprises the steps of: sequentially forming a lower metal layer and an upper metal layer on a layer to be etched; forming an upper metal mask by patterning the upper metal layer; forming a lower metal mask by patterning the lower metal layer using the upper metal mask; and patterning the layer to be etched by using the upper metal mask. |
申请公布号 |
KR20160006029(A) |
申请公布日期 |
2016.01.18 |
申请号 |
KR20140085355 |
申请日期 |
2014.07.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JEON, KYUNG YUB;KIM, DONG CHAN;MIN, GYUNG JIN;PARK, JAE HONG;HAN, JE WOO |
分类号 |
H01L21/027;G03F1/40 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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