发明名称 PATTERNING METHOD USING METAL MASK, AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE COMPRISING THE SAME PATTERNING METHOD
摘要 A technical idea of the present invention is to provide a patterning method using a metal mask, which can easily form a hole at a high aspect ratio, and a method for manufacturing a semiconductor device including the patterning method. The patterning method comprises the steps of: sequentially forming a lower metal layer and an upper metal layer on a layer to be etched; forming an upper metal mask by patterning the upper metal layer; forming a lower metal mask by patterning the lower metal layer using the upper metal mask; and patterning the layer to be etched by using the upper metal mask.
申请公布号 KR20160006029(A) 申请公布日期 2016.01.18
申请号 KR20140085355 申请日期 2014.07.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEON, KYUNG YUB;KIM, DONG CHAN;MIN, GYUNG JIN;PARK, JAE HONG;HAN, JE WOO
分类号 H01L21/027;G03F1/40 主分类号 H01L21/027
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