MEMORY BUILT-IN SELF-TEST FOR DATA PROCESSING APPARATUS

摘要

PROBLEM TO BE SOLVED: To provide a data processing apparatus with memory built-in self-test capability, and a method therefor.SOLUTION: A data processing apparatus has memory and processing circuitry. A memory built-in self-test interface receives a request indicating that a test procedure is to be performed for testing a target memory location. Control circuitry detects the request and reserves a reserved memory location for the testing including the target memory location. During the test procedure, the memory continues servicing memory transactions issued by the processing circuitry that target a memory location other than the reserved location. The processing circuitry is stalled if it tends to access the reserved memory location. The testing comprises short bursts of transactions which occur infrequently.