| 摘要 |
PROBLEM TO BE SOLVED: To provide a method of measuring a position of an imaging device, allowing a distance from an imaging lens to the imaging device and an inclination of the imaging device to be measured by measurement at a single position.SOLUTION: The method of measuring a position of an imaging device is provided in which a distance from an imaging lens 210 to an imaging device 220 and inclination of the imaging device are measured using a light projecting device 100 constituted of a plurality of light projecting parts having the same constitution. In the method, measurement light from a first light projecting part A is vertically incident upon the imaging lens, and all measurement light from other light projecting parts is incident upon the imaging lens at a prescribed angle of incidence relative to an optical axis. A first convergence light pattern A' by the first light projecting part is measured to thereby obtain the distance from the imaging lens to the imaging device and inclination of the imaging device, and a second convergence light pattern B' by a second light projecting part B and a third convergence light pattern C' by a third light projecting part C are measured to thereby obtain a Y-direction inclination angle of the imaging device. A fourth convergence light pattern D' by a fourth light projecting part D and a fifth convergence light pattern E' by a fifth light projecting part E are measured to thereby obtain an X-direction inclination angle of the imaging device. |
