| 摘要 |
PROBLEM TO BE SOLVED: To provide a strobe device that can surely determine degradation of a flash discharge tube.SOLUTION: A light emission check period generation circuit 4 is configured to generate light emission check period signals S2 of light emission check periods T of xenon tubes 1-1, 1-2 and 1-3. Light emission circuits 6-1, 6-2 and 6-3 have: resonance coils 611, 621 and 631; and resonance capacitors 612, 622 and 632. Light emission detection circuits 7-1, 7-2 and 7-3 have: capacitors 711, 721 and 731; diodes 712, 722 and 732; and pnp-type transistors 713, 723 and 733. A NAND circuit 8 is configured to generate inverse signals S3 of logical products of light emission signals S31, S32 and S33. An xenon degradation detection circuit 9 consists of a NAND circuit 9-1 and a latch circuit 9-2. The NAND circuit 9-1 is configured to generate inverse signals S4 of logical products of the light emission check period signal S2 and the signal S3, and the latch circuit 9-2 is configured to be set by a falling of an output signal S4 of the NAND circuit 9-1. |
