发明名称 p-TYPE COPPER NITRIDE SEMICONDUCTOR THIN FILM
摘要 PROBLEM TO BE SOLVED: To provide a copper nitride bipolar semiconductor thin film in which p/n polarity and carrier concentration are controlled.SOLUTION: In p-type and n-type copper nitride semiconductor thin films, a molecular beam epitaxy method having small particle energy in depositing the film is used in order to suppress damage to a copper nitride thin film, a feed rate of a copper source and nitrogen radical is controlled by a quartz oscillator, a conduction type is controlled to be a p-type by controlling a chemical composition of copper nitride Cu3N to be created in excessive nitrogen, and on the other hand, controlled to be an n-type by controlling the chemical composition in excessive copper, a carrier concentration is 10cmor more, and electric conductivity is 10S cmor more. A pn-junction element is formed by laminating a p-type copper nitride semiconductor thin film and an n-type copper nitride semiconductor thin film creating homojunction having an in-plane lattice constant at 1% or less. In a manufacturing method of a copper nitride semiconductor thin film, a feed rate of a copper source and a nitrogen source is controlled, a composition of copper nitride to be created is controlled, and a conduction type is controlled to a p-type or an n-type.
申请公布号 JP2016008324(A) 申请公布日期 2016.01.18
申请号 JP20140129607 申请日期 2014.06.24
申请人 TOKYO INSTITUTE OF TECHNOLOGY 发明人 MATSUZAKI KOSUKE;SUZAKI TOMOFUMI;HOSONO HIDEO
分类号 C23C14/06;H01L21/363;H01L21/365;H01L29/24;H01L31/0256 主分类号 C23C14/06
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