| 摘要 |
PROBLEM TO BE SOLVED: To provide a novel test handler.SOLUTION: A test handler according to one embodiment may include: a load device for loading an electronic component; a soak chamber for preheating or precooling the electronic component so that the loaded electronic component has a test set temperature; a test chamber for testing the electronic component which has had the preheating or precooling completed; a desoak chamber for restoring the temperature of the tested electronic component to a preset level, a passage being formed inside of one side wall, the passage including a first inflow port, an exhaust port, and a second inflow port adjacent to the exhaust port; a circulation device for circulating the internal air of the desoak chamber inside the passage; and an unload device for unloading the electronic component whose temperature is restored to the preset level. |
