发明名称 INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an inspection device that can reduce the time interval of switching a direction of light applied to an inspection target surface, for example.SOLUTION: The inspection device has an opening/closing mechanism for at least one of a first light path from a light source to an inspection target surface through a first applying part and a second light path from the light source to the inspection target surface through a second applying part. The opening/closing mechanism has a movable part movable between an opening position not blocking the light paths and a closing position blocking the light paths and a driving part moving the movable part between the opening and closing positions.
申请公布号 JP2016008857(A) 申请公布日期 2016.01.18
申请号 JP20140128455 申请日期 2014.06.23
申请人 RICOH ELEMEX CORP 发明人 KYOYA FUMIHIKO
分类号 G01N21/84;G01N21/892;G01N21/95 主分类号 G01N21/84
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