| 摘要 |
The present invention relates to a method for testing array fuse of a semiconductor apparatus. A series of operations for testing an array fuse block of the semiconductor apparatus are performed as a test program is executed. The series of operations may comprise: a test source file generation step of generating a test source file including information for accessing the array fuse block; a test vector generation step of generating a test vector by using the test source file; a first extraction step of extracting repair confirmation information by performing a simulation using the test vector; a second extraction step of extracting an expected value of the repair confirmation information from the test source file; and a determination step of determining whether the array fuse block has passed or failed by comparing the repair confirmation information with the expected value of the repair confirmation information. |
