发明名称 |
MEASURING METHOD OF FREEFORM CURVED SURFACE USING CURVATURE OF A PART AREA |
摘要 |
The present invention relates to a method for measuring a shape of a free-form surface using a curvature of a partial area. The purpose of the present invention is to provide a method for measuring a shape of a free-form surface, capable of accurately measuring the shape of a free-form surface through a simple process. The other purpose of the present invention is to provide a method for measuring a shape of a free-form surface capable of being combined in an X-Y direction between partial areas adjacent to a partial area of a curve to be measured. According to the present invention, the method for measuring a shape of a free-form surface includes: a step of dividing a free-formed surface to be measured into multiple fine partial areas in a plane; a step of measuring an X-directional curvature and a Y-directional curvature on the each fine partial area; a step of generating an X-axis curvature matrix map and a Y-axis curvature matrix map of the free-formed surface to be measured based on the X-directional curvature and the Y-directional curvature; a step of generating an X-axis inclination value matrix map and a Y-axis inclination value matrix map by using a Frenet equation from the X-axis curvature matrix map and the Y-axis curvature matrix map; and a step of generating a shaping matrix of the free-formed surface to be measured by integrating the X-axis inclination value matrix map and the Y-axis inclination value matrix map. |
申请公布号 |
KR101584723(B1) |
申请公布日期 |
2016.01.15 |
申请号 |
KR20140174016 |
申请日期 |
2014.12.05 |
申请人 |
INDUSTRY-ACADEMIC COOPERATION FOUNDATION OF KYUNGNAM UNIVERSITY;KOREA BASIC SCIENCE INSTITUTE |
发明人 |
KIM, BYUNG CHANG;KIM, GEON HEE;HYUN, SANG WON |
分类号 |
G01B11/24;G01B9/02;G01B11/255 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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