摘要 |
Introduced is a cap inspection device capable of obtaining a stable and precise image when inspecting a cap. The cap inspection device can comprise: a first rail and a second rail for moving a cap, wherein the second rail receives and moves the cap provided from the first rail; a guide unit for guiding the cap from one of the first rail and the second rail to the other of the first rail and the second rail, and for switching the inner surface of the cap to the outer surface of the cap or switching the outer surface of the cap to the inner surface of the cap; a first inspection module for inspecting the inner surface of the cap at the upper side of the first rail; and a second inspection module for inspecting the outer surface of the cap at the upper side of the second rail. |