发明名称 SUBSTRATE POLISHING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a substrate polishing apparatus which can efficiently prevent gas diffusion near a generation point of a harmful gas.SOLUTION: A substrate polishing apparatus comprises: a rotatable polishing table 30; a top ring 31 for holding a wafer W and polishing the wafer W by pushing the wafer W to the polishing table 30; and a local exhaust system 35 having an air intake head 36 arranged near the top ring 31. The air intake head 36 is arranged on the downstream side of a rotation direction of the polishing table 30 with respect to the top ring 31.
申请公布号 JP2016006856(A) 申请公布日期 2016.01.14
申请号 JP20150098706 申请日期 2015.05.14
申请人 EBARA CORP 发明人 SHINOZAKI HIROYUKI;SONE CHUICHI;AONO HIROSHI;SHINKAI TAKESHI
分类号 H01L21/304;B24B55/00;B24B55/03 主分类号 H01L21/304
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