发明名称 |
SUBSTRATE POLISHING APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a substrate polishing apparatus which can efficiently prevent gas diffusion near a generation point of a harmful gas.SOLUTION: A substrate polishing apparatus comprises: a rotatable polishing table 30; a top ring 31 for holding a wafer W and polishing the wafer W by pushing the wafer W to the polishing table 30; and a local exhaust system 35 having an air intake head 36 arranged near the top ring 31. The air intake head 36 is arranged on the downstream side of a rotation direction of the polishing table 30 with respect to the top ring 31. |
申请公布号 |
JP2016006856(A) |
申请公布日期 |
2016.01.14 |
申请号 |
JP20150098706 |
申请日期 |
2015.05.14 |
申请人 |
EBARA CORP |
发明人 |
SHINOZAKI HIROYUKI;SONE CHUICHI;AONO HIROSHI;SHINKAI TAKESHI |
分类号 |
H01L21/304;B24B55/00;B24B55/03 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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