SOCKET FOR TESTING ELECTRONICS

摘要

The present invention relates to an electronic component testing socket. The electronic component testing socket includes: a body unit which has guide grooves formed on the front and rear part adjacent to a mounting hole connected to an electronic component to be tested; a pair of floating units which is connected to each guide groove and has a conductive pin arranged on a surface to be connected to the terminal of the testing target electronic component; a link unit which is connected to the floating unit pair to interlink; and a conveying unit which is connected to either of the floating units in the pair to transmit power to the floating units to connect the conductive pin and the testing target electronic component. The electronic component testing socket can enhance the efficiency of an inspection operation.