发明名称 METHOD FOR PRODUCING SiC WAFER, METHOD FOR PRODUCING SiC SEMICONDUCTOR, AND SILICON CARBIDE COMPOSITE SUBSTRATE
摘要 Provided is a method for producing an SiC wafer, said method comprising: a step of preparing a silicon carbide composite substrate that has a vitreous carbon layer on the surface of an SiC substrate and a CVD-SiC layer atop the vitreous carbon layer, and preparing a single-crystal SiC substrate that has on the surface an ion injection layer into which hydrogen ions have been injected; a joining step in which a joined body is obtained by bonding the CVD-SiC layer of the silicon carbide composite substrate and the ion injection layer of the single-crystal SiC substrate; a first separation step in which a single-crystal coated substrate is obtained by heating the joined body and separating the ion injection layer from the single-crystal SiC substrate; and a second separation step in which an SiC wafer is obtained by separating the vitreous carbon layer and CVD-SiC layer of the single-crystal coated substrate.
申请公布号 WO2016006640(A1) 申请公布日期 2016.01.14
申请号 WO2015JP69702 申请日期 2015.07.08
申请人 IBIDEN CO., LTD. 发明人 FURUICHI WATARU;OSADA JUNJI;MIZUMUKAI YUKI
分类号 H01L21/02;H01L21/265 主分类号 H01L21/02
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