发明名称 |
METHOD FOR PRODUCING SiC WAFER, METHOD FOR PRODUCING SiC SEMICONDUCTOR, AND SILICON CARBIDE COMPOSITE SUBSTRATE |
摘要 |
Provided is a method for producing an SiC wafer, said method comprising: a step of preparing a silicon carbide composite substrate that has a vitreous carbon layer on the surface of an SiC substrate and a CVD-SiC layer atop the vitreous carbon layer, and preparing a single-crystal SiC substrate that has on the surface an ion injection layer into which hydrogen ions have been injected; a joining step in which a joined body is obtained by bonding the CVD-SiC layer of the silicon carbide composite substrate and the ion injection layer of the single-crystal SiC substrate; a first separation step in which a single-crystal coated substrate is obtained by heating the joined body and separating the ion injection layer from the single-crystal SiC substrate; and a second separation step in which an SiC wafer is obtained by separating the vitreous carbon layer and CVD-SiC layer of the single-crystal coated substrate. |
申请公布号 |
WO2016006640(A1) |
申请公布日期 |
2016.01.14 |
申请号 |
WO2015JP69702 |
申请日期 |
2015.07.08 |
申请人 |
IBIDEN CO., LTD. |
发明人 |
FURUICHI WATARU;OSADA JUNJI;MIZUMUKAI YUKI |
分类号 |
H01L21/02;H01L21/265 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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