发明名称 |
SEMICONDUCTOR DEVICE, MANUFACTURING METHOD OF THE SAME AND ELECTRONIC APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device suitable for miniaturization and densification.SOLUTION: A semiconductor device comprises a first transistor, a first insulation film on the first transistor, a second insulation film on the first insulation film, a second transistor on the second insulation film, a first conductive film electrically connected to the first transistor, and a second conductive film electrically connected to the first conductive film and the second transistor. The first conductive film pierces the first insulation film and the second conductive film pierces the second insulation film and a semiconductor film and a source electrode or a drain electrode of the second transistor. A channel formation region of the first transistor has a single crystal semiconductor and a channel formation region of the second transistor has an oxide semiconductor, and a width of a bottom face of the second conductive film is equal to or less than 5 nm. |
申请公布号 |
JP2016006855(A) |
申请公布日期 |
2016.01.14 |
申请号 |
JP20150098705 |
申请日期 |
2015.05.14 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
KURATA MOTOMU;SASAGAWA SHINYA;HODO RYOTA;TOCHIBAYASHI KATSUAKI;MORIWAKA TOMOAKI;NISHIDA JIRO;MIYAIRI HIDEKAZU;YAMAZAKI SHUNPEI |
分类号 |
H01L21/8234;H01L21/3205;H01L21/336;H01L21/768;H01L21/822;H01L21/8242;H01L23/522;H01L27/04;H01L27/06;H01L27/08;H01L27/088;H01L27/10;H01L27/108;H01L29/786 |
主分类号 |
H01L21/8234 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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