发明名称 SEMICONDUCTOR STRUCTURE AND MANUFACUTING METHOD OF THE SAME
摘要 The present disclosure provides a semiconductor structure. The structure includes a first substrate; a first dielectric layer having a first surface in proximity to the first substrate and a second surface away from the first substrate; a first interconnect penetrating the first surface of the first dielectric layer; and a protection layer extending along a portion of a sidewall of the first interconnect. A thickness of the protection layer is in a range of from about 0.02 μm to about 0.2 μm.
申请公布号 US2016013118(A1) 申请公布日期 2016.01.14
申请号 US201414331046 申请日期 2014.07.14
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. 发明人 TSAI TSUNG-HAN;CHIEN VOLUME;HSU YUNG-LUNG;TSENG CHUNG-BIN;LIAO KENG-YING;CHEN PO-ZEN
分类号 H01L23/48;H01L27/06;H01L21/768 主分类号 H01L23/48
代理机构 代理人
主权项 1. (canceled)
地址 HSINCHU TW