SEMICONDUCTOR APPARATUS AND TEST METHOD THEREOF

摘要

A semiconductor apparatus includes first and second chips sharing first and second data channels. The first chip compresses first test data of the first chip and outputs the compressed first test data through the first data channel in a first test mode, and the second chip compresses second test data of the second chip and outputs the compressed second test data through the second data channel in the first test mode.

主权项

1. A semiconductor apparatus comprising:
a first data output unit connected to a first data channel; a second data output unit connected to a second data channel; and a compression test data generating unit configured to generate compression data in response to a chip selection signal and first and second test data and output the compression data to one of the first and second data output units, wherein the first data output unit outputs one of the first test data and the compression data through the first data channel in response to a control signal, and the second data output unit outputs one of the second test data and the compression data through the second data channel in response to the control signal.