发明名称 WAFER LEVEL SPECTROMETER
摘要 A sensor apparatus has a substrate and a spectrally selective detection system, and a cover. The spectrally sensitive detection system is sandwiched between the substrate and the cover. The spectrally selective detection system includes a generally laminar array of wavelength selectors optically coupled to a corresponding array of optical detectors located within the substrate. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.
申请公布号 US2016011046(A1) 申请公布日期 2016.01.14
申请号 US201514860598 申请日期 2015.09.21
申请人 KLA Tencor 发明人 Jensen Earl M.;Sun Mei H.;O'Brien Kevin
分类号 G01J3/02 主分类号 G01J3/02
代理机构 代理人
主权项 1. A sensor apparatus, comprising: a) a substrate; b) a spectrally selective detection system that includes a generally laminar array of optical wavelength selectors optically coupled to a corresponding array of optical detectors located within the substrate; c) a cover, wherein the spectrally sensitive detection system is sandwiched between the substrate and the cover.
地址 Milpitas CA US
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