发明名称 半導体装置
摘要 A trench structure which is capable of promoting extension of a depletion layer and hardly causes thermal stress is provided. A semiconductor device includes a semiconductor substrate. A plurality of loop trenches is formed on the surface of the semiconductor substrate. Each loop trench is configured to extend so as to surround a region smaller than the region where a plurality of gate trenches is formed. Each loop trench is separated from other loop trenches. A second insulating layer is located in each loop trench. P-type fourth regions are formed in the semiconductor substrate. Each fourth region is in contact with a bottom surface of corresponding one of the loop trenches and is configured to extend along the corresponding one of the loop trenches.
申请公布号 JP5842896(B2) 申请公布日期 2016.01.13
申请号 JP20130234341 申请日期 2013.11.12
申请人 トヨタ自動車株式会社 发明人 高谷 秀史;朽木 克博
分类号 H01L29/06;H01L29/12;H01L29/78 主分类号 H01L29/06
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