发明名称 フレキシブル半導体装置及びその製造方法
摘要 <p>There is provided a method for manufacturing a flexible semiconductor device. The method of the flexible semiconductor device according to the present invention comprises the steps of: (i) forming an insulating layer on one of principal surfaces of a metal foil; (ii) forming a semiconductor layer on the insulating layer, and then forming source and drain electrodes so that the source and drain electrodes contact with the semiconductor layer; (iii) forming a flexible film layer so that the flexible film layer covers the semiconductor layer and the source and drain electrodes; (iv) forming vias in the flexible film layer, and thereby a semiconductor device precursor is provided; and (v) subjecting the metal foil to a processing treatment, and thereby forming a gate electrode from the metal foil, wherein, in the step (v) of the processing treatment of the metal foil, the gate electrode is formed in a predetermined position by using at least one of the vias of the semiconductor device precursor as an alignment marker.</p>
申请公布号 JP5842180(B2) 申请公布日期 2016.01.13
申请号 JP20120538898 申请日期 2012.02.21
申请人 パナソニックIPマネジメント株式会社 发明人 鈴木 武;平野 浩一;増田 忍
分类号 H01L21/336;G09F9/00;G09F9/30;H01L21/768;H01L23/532;H01L29/786;H01L51/50;H05B33/10;H05B33/12;H05B33/14 主分类号 H01L21/336
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