| 摘要 |
The present invention relates to a semiconductor memory device which stores a repair object address and performs a repair operation by using the same in a normal operation. The semiconductor memory device comprises a memory cell array which includes word lines, a repair fuse part for programing the repair object address, an address generation part which responds to the programmed information of the repair fuse part in a test operation and generates a test address corresponding to the word lines, and a word line control part which responds to the test address and controls the activation of the word lines. |
