发明名称 HARDMASK COMPOSITION AND METHOD OF FORMING PATTERNING USING THE HARDMASK COMPOSITION
摘要 Disclosed is a hardmask composition which comprises: (i) a first material selected among polymers which are composed of aromatic ring-containing monomers and a repeating unit comprising aromatic ring-containing monomers; (ii) one or more second materials selected from the group comprising a two-dimensional carbon nanostructure and a precursor thereof, wherein the two-dimensional carbon nanostructure further comprises hexagonal boron nitride, a chalcogenide-based material, and 0.01-40 atom% of oxygen; and (iii) a solvent. In addition, disclosed is a pattern formation method using the hardmask composition.
申请公布号 KR20160004831(A) 申请公布日期 2016.01.13
申请号 KR20140083905 申请日期 2014.07.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIN, HYEON JIN;KIM, SANG WON;PARK, SEONG JUN
分类号 G03F7/11;G03F7/00;H01L21/027 主分类号 G03F7/11
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