| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To improve efficiency of insulation tests between each conductor pattern of a circuit board. <P>SOLUTION: In testing insulation between each of 16 conductor patterns, a number of connection processing are carried out in a predetermined order. The connection processing comprises; an A-type connection processing in which conductor patterns numbered 1 to 3 and 6 to 10 are connected to low electric potential as a group 1, and other conductor patterns are connected to high electric potential as a group 2; a B-type connection processing in which conductor patterns numbered 3 to 6 and 9 to 12 are connected to the low electric potential as a first group, and other conductor patterns are connected to the high electric potential as a second group; C-type connection processing in which conductor patterns numbered 1 to 4, 10, 11, 15, and 16 are connected to the low electric potential as a first group and other conductor patterns are connected to the high electric potential as a second group; and a D-type connection processing in which conductor patterns numbered 2 to 7, 14, and 15 are connected to the low electric potential as a first group and other conductors are connected to the high electric potential as a group 2. <P>COPYRIGHT: (C)2013,JPO&INPIT</p> |
