METHOD AND DEVICE FOR MEASURING THERMOELECTRIC CHARACTERISTICS OF COMBINATORIAL SPECIMEN

摘要

The present invention provides a method and device for measuring thermoelectric characteristics of a combinatorial sample, wherein the method and device are useful for rapid sample evaluation, the investigation of thermoelectric materials, and the carrier control of semiconductors. The device includes combinatorial samples (10) patterned with a metal mask, a pair of sample holders (11 and 12) for applying a small temperature gradient to the sample (10), a thermocouple (14) for measuring the temperature gradient, and a probe pin array (15) in contact with the sample (10).