发明名称 Oxide semiconductor device including photodiode
摘要 A solid-state image sensing element including a transistor with stable electrical characteristics (e.g., significantly low off-state current) is provided. Two different element layers (an element layer including an oxide semiconductor layer and an element layer including a photodiode) are stacked over a semiconductor substrate provided with a driver circuit such as an amplifier circuit, so that the area occupied by a photodiode is secured. A transistor including an oxide semiconductor layer in a channel formation region is used as a transistor electrically connected to the photodiode, which leads to lower power consumption of a semiconductor device.
申请公布号 US9236408(B2) 申请公布日期 2016.01.12
申请号 US201313864465 申请日期 2013.04.17
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 Yamazaki Shunpei
分类号 H01L31/062;H01L27/146 主分类号 H01L31/062
代理机构 Nixon Peabody LLP 代理人 Nixon Peabody LLP ;Costellia Jeffrey L.
主权项 1. A semiconductor device comprising: a driver circuit comprising a first transistor comprising a first channel formation region, the first transistor being provided on a top surface of a semiconductor substrate; a second transistor comprising an oxide semiconductor layer including indium in a second channel formation region over the first transistor; and a photodiode over the second transistor, the photodiode being electrically connected to the second transistor, wherein a gate electrode layer of the second transistor overlaps a gate electrode layer of the first transistor when seen from a direction perpendicular to the top surface of the semiconductor substrate.
地址 Kanagawa-ken JP