发明名称 Channel quality information and beam index reporting
摘要 A method and apparatus report or identify channel quality information. The method for reporting includes selecting one or more beams for channel quality reporting. The method also includes mapping, by the UE, indices of the one or more selected beams to one or more channel quality values. Additionally, the method includes sending channel quality information for the one or more selected beams according to the mapping. The method for identifying includes receiving an indication of indices of one or more beams selected for reporting. The method also includes receiving channel quality information for the one or more selected beams. The method further includes identifying a mapping of the indices of the one or more selected beams to one or more channel quality values. Additionally, the method includes identifying a channel quality value for each of the one or more selected beams according to the mapping.
申请公布号 US9237475(B2) 申请公布日期 2016.01.12
申请号 US201313781311 申请日期 2013.02.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Josiam Kaushik Morapakkam;Gupta Ankit;Abu-Surra Shadi;Pi Zhouyue;Li Ying;Rajagopal Sridhar
分类号 H04W24/10;H04W72/04 主分类号 H04W24/10
代理机构 代理人
主权项 1. A method for reporting channel quality information by a user equipment (UE), the method comprising: selecting beams for channel quality reporting; mapping, by the UE, indices of the selected beams to one or more channel quality values; indicating indices of the selected beams during one portion of a reporting period; and sending channel quality information for the selected beams according to the mapping during an other portion of the reporting period, the channel quality information sent during the other portion indicating more than one channel quality value for one of the selected beams before any re-indication of the index of the one selected beam during the reporting period.
地址 Suwon-Si KR
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