| 发明名称 | Semiconductor memory apparatus and temperature control method thereof | ||
| 摘要 | A semiconductor memory apparatus and a temperature control method thereof are provided. The semiconductor memory apparatus includes a temperature adjustment unit suitable for adjusting a temperature of a memory cell, and a temperature control unit suitable for sensing a temperature of the temperature adjustment unit, comparing a sensed temperature with a reference temperature range, and controlling the temperature adjustment unit to adjust the temperature thereof within the reference temperature range based on a comparison result. | ||
| 申请公布号 | US9236121(B2) | 申请公布日期 | 2016.01.12 |
| 申请号 | US201414158496 | 申请日期 | 2014.01.17 |
| 申请人 | SK Hynix Inc. | 发明人 | Lee Seung Yun;Park Hae Chan;Kim Myoung Sub;Lee Se Ho |
| 分类号 | G11C11/00;G11C13/00;G11C7/04 | 主分类号 | G11C11/00 |
| 代理机构 | IP & T Group LLP | 代理人 | IP & T Group LLP |
| 主权项 | 1. A semiconductor memory apparatus, comprising: a temperature adjustment unit suitable for adjusting a temperature of a memory cell; and a temperature control unit suitable for sensing a temperature of the temperature adjustment unit, comparing a sensed temperature with a reference temperature range, and controlling the temperature adjustment unit to adjust the temperature thereof within the reference temperature range based on a comparison result, wherein the temperature adjustment unit is formed over a cell area of a semiconductor substrate in which a data storage region is formed. | ||
| 地址 | Gyeonggi-do KR | ||