Semiconductor device

摘要

A semiconductor device includes: a semiconductor substrate having a main surface having an element formation region, a guard ring, a guard ring electrode, a channel stopper region, a channel stopper electrode, and a field plate disposed over and insulated from the semiconductor substrate. The field plate includes a first portion located between the main surface of the semiconductor substrate and the guard ring electrode, and a second portion located between the main surface of the semiconductor substrate and the channel stopper electrode. The first portion has a portion overlapping with the guard ring electrode when viewed in a plan view. The second portion has a portion overlapping with the channel stopper electrode when viewed in the plan view. In this way, a semiconductor device allowing for stabilized breakdown voltage can be obtained.

主权项

1. A semiconductor device, comprising:
a semiconductor substrate having a main surface having an element formation region at a center of the semiconductor substrate; a plurality of guard ring electrodes formed on said main surface of said semiconductor substrate to surround a circumference of said element formation region when said plurality of guard ring electrodes and said element formation region is viewed from a plan view; a plurality of guard rings formed in said main surface of said semiconductor substrate and electrically connected, respectively, to said plurality of guard ring electrodes; a channel stopper electrode formed on said main surface of said semiconductor substrate to be located outside of said plurality of guard ring electrodes when said channel stopper electrode and said plurality of guard ring electrodes are viewed in the plan view; a channel stopper region formed in said main surface of said semiconductor substrate and electrically connected to said channel stopper electrode; and a field plate disposed over and insulated from said semiconductor substrate, said field plate including a first portion disposed to surround a circumference of an outermost guard ring electrode of the plurality of guard ring electrodes when said first portion and the plurality of guard ring electrodes are viewed from the plan view, said field plate including a second portion located between said main surface of said semiconductor substrate and the outermost guard ring electrode, and a third portion located between said main surface of said semiconductor substrate and said channel stopper electrode, said second portion having a portion overlapping with the outermost guard ring electrode when viewed in a cross-section view, said third portion having a portion overlapping with said channel stopper electrode when viewed in the cross-section view.