发明名称 Schottky barrier diode and method for manufacturing schottky barrier diode
摘要 A Schottky barrier diode and a method of manufacturing the Schottky barrier diode are provided. The diode includes an n− type epitaxial layer disposed on a first surface of an n+ type silicon carbide substrate and having an upper surface, a lower surface, and an inclined surface that connects the upper surface and the lower surface. A p region is disposed on the inclined surface of the n− type epitaxial layer and a Schottky electrode is disposed on the upper surface of the n− type epitaxial layer and the p region. In addition, an ohmic electrode is disposed on a second surface of the n+ type silicon carbide substrate.
申请公布号 US9236500(B2) 申请公布日期 2016.01.12
申请号 US201314143735 申请日期 2013.12.30
申请人 Hyundai Motor Company 发明人 Lee Jong Seok;Hong Kyoung-Kook;Chun Dae Hwan;Jung Youngkyun
分类号 H01L29/06;H01L29/872;H01L29/66;H01L29/16 主分类号 H01L29/06
代理机构 Mintz Levin Cohn Ferris Glovsky and Popeo, P.C. 代理人 Mintz Levin Cohn Ferris Glovsky and Popeo, P.C. ;Corless Peter F.
主权项 1. A Schottky barrier diode, comprising: an n− type epitaxial layer disposed on a first surface of an n+ type silicon carbide substrate and having an upper surface, a lower surface, and an inclined surface that connects the upper surface and the lower surface; a p region disposed on the inclined surface of the n− type epitaxial layer; a Schottky electrode disposed on the upper surface of the n− type epitaxial layer and the p region; and an ohmic electrode disposed on a second surface of the n+ type silicon carbide substrate, wherein the n− type epitaxial layer exposes a portion of the first surface of the n+ type silicon carbide substrate, and the p region extends along the first surface of the exposed n+ type silicon carbide substrate.
地址 Seoul KR