| 摘要 |
PROBLEM TO BE SOLVED: To perform three-dimensional measurement while removing the influence of indirectly reflected light including internal scattering.SOLUTION: A projection pattern generation section 202 acquires a first patten group formed by masking a bright part in each of spacial coding patterns, which are different in width of at least one of the bright part and a dark part, with a mask of a predetermined pattern, and a second pattern group formed by masking the bright part in each of the spacial coding patterns with a mask of a different pattern. An image input section 204 inputs images 505 obtained by imaging apparatuses 102 capturing an object on which the first pattern group and the second pattern group are projected by a projection apparatus 101. An image processing section 205 detects correspondence between projection coordinates of the spacial coding pattern 502 and coordinates of the captured image 505. A three-dimensional coordinate calculation section 208 measures a three-dimensional shape of the object, on the basis of the correspondence. |
