| 摘要 |
PROBLEM TO BE SOLVED: To provide a solid-state imaging apparatus capable of acquiring a high-quality image while reducing circuit scale and reducing a flaw correction error.SOLUTION: The solid-state imaging apparatus includes a flaw correction circuit 28. The flaw correction circuit 28 includes a color difference calculation section 32, a color difference selection circuit 35 that is a color difference selection section, and a correction amount calculation section 36. The color difference calculation section 32 calculates a differential between a signal level of same color pixels in a pixel group and a signal level of different color pixels neighboring to the same color pixels. The pixel group is formed from pixels which are arranged in parallel in a horizontal direction around a pixel of interest. The color difference selection section selects any one of differentials which are calculated for the same color pixels and the different color pixels included in the pixel group. The correction amount calculation section 36 calculates a correction amount with respect to the pixel of interest on the basis of the differential that is selected by the color difference selection section, and the signal level of the different color pixels neighboring to the pixel of interest in the pixel group. |
