发明名称 |
Semiconductor device and method for forming the same |
摘要 |
A semiconductor device includes a junction region on both sides of a trench in a semiconductor substrate, a first gate electrode with a first workfunction buried in the trench, and a second gate electrode formed of a polycide layer having a second workfunction overlapping with the junction region at an upper part of the first gate electrode. |
申请公布号 |
US9236439(B2) |
申请公布日期 |
2016.01.12 |
申请号 |
US201414310839 |
申请日期 |
2014.06.20 |
申请人 |
SK HYNIX INC. |
发明人 |
Jeong Young Doo |
分类号 |
H01L29/423;H01L29/49;H01L29/778;H01L29/66;H01L29/45 |
主分类号 |
H01L29/423 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a trench in a semiconductor substrate; a junction region disposed on two sides of the trench; a first gate electrode buried in the trench in such a manner that the first gate electrode has a step difference at a top surface thereof and has a first workfunction; and a second gate electrode disposed over the first gate electrode, the second gate electrode including a polycide material and having a second workfunction, wherein the second gate electrode overlaps with the junction region, and wherein the second gate electrode surrounds an upper portion of the first gate electrode. |
地址 |
Icheon KR |