发明名称 Semiconductor device and method for forming the same
摘要 A semiconductor device includes a junction region on both sides of a trench in a semiconductor substrate, a first gate electrode with a first workfunction buried in the trench, and a second gate electrode formed of a polycide layer having a second workfunction overlapping with the junction region at an upper part of the first gate electrode.
申请公布号 US9236439(B2) 申请公布日期 2016.01.12
申请号 US201414310839 申请日期 2014.06.20
申请人 SK HYNIX INC. 发明人 Jeong Young Doo
分类号 H01L29/423;H01L29/49;H01L29/778;H01L29/66;H01L29/45 主分类号 H01L29/423
代理机构 代理人
主权项 1. A semiconductor device comprising: a trench in a semiconductor substrate; a junction region disposed on two sides of the trench; a first gate electrode buried in the trench in such a manner that the first gate electrode has a step difference at a top surface thereof and has a first workfunction; and a second gate electrode disposed over the first gate electrode, the second gate electrode including a polycide material and having a second workfunction, wherein the second gate electrode overlaps with the junction region, and wherein the second gate electrode surrounds an upper portion of the first gate electrode.
地址 Icheon KR