Method and apparatus for monitoring ion lens connections

摘要

This technology is directed to a method and apparatus for monitoring or testing defects associated with an ion lens connected within a mass spectrometer. In some implementations, the testing mechanism monitors a connection of one or more ion lenses configured in the mass spectrometer to determine if voltage is effectively applied to the ion lens. The testing circuit of the present technology includes at least one Zener diode added to the voltage divider and monitoring a change in slope of the applied voltage versus the voltage at the read-back circuit. The change in slope may be easily measured.

主权项

1. An apparatus for monitoring defects or the status of a connection of at least one ion lens disposed within a mass spectrometer, the apparatus comprising:
an ion lens voltage supply for applying voltage to the at least one ion lens within the mass spectrometer; a read-back circuit connected to the at least one ion lens within the mass spectrometer and configured to provide output responses to reflect a first read-back voltage measurement if the at least one ion lens is connected and to reflect a second read-back voltage measurement if the at least one ion lens is not connected; and a test circuit including at least one Zener diode configured between the ion lens voltage supply and a reference point, to measure the output responses from the read-back circuit and for indicating a reading of the first read-back voltage measurement reflecting a reduction in voltage when the Zener diode begins conducting, the reading reflecting the reduction in voltage indicating a change in slope of a voltage applied by the ion lens voltage supply versus a voltage at the read-back circuit; wherein the test circuit comprises two Zener diodes, configured back-to-back.