发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To maintain high breakdown voltage and reduce on-resistance.SOLUTION: A semiconductor device comprises: an ntype silicon carbide substrate; an n type silicon carbide epitaxial layer; a ptype region 3 which is selectively formed on the surface layer of the n type silicon carbide epitaxial layer; a p base layer formed on the n type silicon carbide epitaxial layer and the ptype region 3; an nsource region which is selectively formed on a surface layer of the p base layer; a pcontact region formed on the p base layer; an n type well region formed so as to penetrate the p base layer from a surface thereof and reach the n type silicon carbide epitaxial layer; a gate electrode provided via a gate insulating film; a source electrode; and a drain electrode. The ptype region 3 is periodically arranged so that the planar shape thereof becomes rectangle and the sides thereof become parallel to the sides of the adjacent ptype region 3. The ptype region 3 is connected to the adjacent ptype region 3 at two facing corners 3a, and the nsource region and the pcontact region are divided into a plurality of cells. |
申请公布号 |
JP2016004966(A) |
申请公布日期 |
2016.01.12 |
申请号 |
JP20140126260 |
申请日期 |
2014.06.19 |
申请人 |
FUJI ELECTRIC CO LTD |
发明人 |
KINOSHITA AKIMASA;HOSHI YASUYUKI;HARADA YUICHI |
分类号 |
H01L29/78;H01L29/06;H01L29/12 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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