DEVICE FOR ANALYZING DEFORMABILITY AND FATIGUE CHARACTERISTIC OF PARTICLES

摘要

An apparatus for analyzing fine particles includes: a chamber which includes an inlet unit and an outlet unit and provides a space for flow of fluid including the fine particles; one or more separation wall structure which are arranged in the chamber and form a plurality of flow channels in the chamber; variable thin film structures which are arranged in each flow channel and form a contraction unit for deforming the fine particles passing through the flow channels; one or more thin film control lines for applying pressure to each variable thin film structure; and a pair of electrode patterns which are arranged on both sides of the contraction unit of the flow channels and detect electric characteristics of the fine particles passing through the flow channels.