发明名称 TEST DATA GENERATION ASSISTANCE DEVICE AND TEST DATA GENERATION ASSISTANCE METHOD
摘要 [Problem] To assist in creating test data. [Solution] The present invention stores a target source code, which is a source code to be tested, an observation point, which is information identifying a point in the target source code at which the execution state of the program is to be checked, and an input point, which is information identifying a point in the target source code at which test data is to be input, and performs: a first process for performing symbolic execution on the processing unit that includes the observation point, and for obtaining a path constraint from trace elements, which are information including information about the processing operation and the status of variables corresponding to the observation point; and a second process for, until the processing unit including the input point is reached, repeating processing to perform symbolic execution on the caller processing unit which calls the current processing unit, identify the ones of the trace elements for the caller processing unit that satisfy the obtained path constraint, and obtain a path constraint from the identified trace elements. On the basis of the identified trace elements, the present invention generates conditions that the test data should satisfy.
申请公布号 WO2016001982(A1) 申请公布日期 2016.01.07
申请号 WO2014JP67416 申请日期 2014.06.30
申请人 HITACHI, LTD. 发明人 NAKAGAWA, YUICHIROH;SUZUKI, YASUFUMI;ICHII, MAKOTO;NOGUCHI, HIDETO
分类号 G06F11/28;G06F11/36 主分类号 G06F11/28
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