| 发明名称 |
METHODS FOR MANUFACTURING AND OPERATING A MEMORY DEVICE AND A METHOD FOR OPERATING A SYSTEM HAVING THE SAME |
| 摘要 |
A method for manufacturing a memory device includes detecting, with a tester, whether memory cells included in a memory device are defective, and programming, with the tester, start addresses of defect-free memory regions for addressing modes of the memory device based on a result of the detection. |
| 申请公布号 |
US2016005454(A1) |
申请公布日期 |
2016.01.07 |
| 申请号 |
US201514792727 |
申请日期 |
2015.07.07 |
| 申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
MUN Kui Yon;CHO Young Jin;YOO Young Kwang |
| 分类号 |
G11C11/4096;G06F12/02;G06F9/44;G11C7/10;G11C11/408;G11C29/04 |
主分类号 |
G11C11/4096 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method for manufacturing a memory device, comprising:
detecting, with a tester, whether memory cells included in a memory device are defective; and programming, with the tester, start addresses of defect-free memory regions for addressing modes in the memory device based on a result of the detection. |
| 地址 |
Gyeonggi-do KR |
