发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
摘要 Provided is a method for manufacturing a semiconductor device with which it is possible to sufficiently improve channel mobility. The surface layer of a silicon carbide base (11) of a wafer (W) is exposed to a halogen atmosphere containing fluorine that was dissociated from silicon tetrafluoride gas using plasma, and a gate insulation film (15) is formed on the exposed surface layer.
申请公布号 WO2016002916(A1) 申请公布日期 2016.01.07
申请号 WO2015JP69217 申请日期 2015.06.26
申请人 TOKYO ELECTRON LIMITED;OSAKA UNIVERSITY 发明人 AZUMO, SHUJI;MORISHIMA, MASATO;OUCHI, KENJI;KATOU, TAIKI;WATANABE, HEIJI;SHIMURA, TAKAYOSHI;HOSOI, TAKUJI
分类号 H01L21/336;H01L21/316;H01L21/318;H01L29/78 主分类号 H01L21/336
代理机构 代理人
主权项
地址