发明名称 SAMPLE HOLDER
摘要 A sample holder includes a substrate composed of ceramics, having a sample holding surface provided in an upper face thereof; a supporting member composed of metal, an upper face of the supporting member covering a lower face of the substrate; and a joining layer composed of indium or an indium alloy, the substrate and the supporting member being joined to each other via the joining layer. The joining layer has a layer region in at least one of a joining surface to the substrate and a joining surface to the supporting member, a content percentage of indium oxides of the layer region being higher than that of an intermediate region in a thickness direction of the joining layer.
申请公布号 US2016005639(A1) 申请公布日期 2016.01.07
申请号 US201414770045 申请日期 2014.02.24
申请人 KYOCERA CORPORATION 发明人 ONO Hiroshi
分类号 H01L21/687;H01L21/683 主分类号 H01L21/687
代理机构 代理人
主权项 1. A sample holder, comprising: a substrate composed of ceramics, having a sample holding surface provided in an upper face thereof; a supporting member composed of metal, an upper face of the supporting member covering a lower face of the substrate; and a joining layer composed of indium or an indium alloy, the substrate and the supporting member being joined to each other via the joining layer, the joining layer having a layer region in at least one of a joining surface to the substrate and a joining surface to the supporting member, a content percentage of indium oxides of the layer region being higher than that of an intermediate region in a thickness direction of the joining layer.
地址 Kyoto-shi, Kyoto JP