发明名称 METHOD FOR INTEGRATED CIRCUIT PATTERNING
摘要 A method of forming a target pattern includes forming a plurality of lines over a substrate with a first mask and forming a first spacer layer over the substrate, over the plurality of lines, and onto sidewalls of the plurality of lines. The plurality of lines is removed, thereby providing a patterned first spacer layer over the substrate. The method further includes forming a second spacer layer over the substrate, over the patterned first spacer layer, and onto sidewalls of the patterned first spacer layer, and forming a patterned material layer over the second spacer layer with a second mask. Whereby, the patterned material layer and the second spacer layer collectively define a plurality of trenches.
申请公布号 US2016005617(A1) 申请公布日期 2016.01.07
申请号 US201514853857 申请日期 2015.09.14
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Wu Chieh-Han;Tsai Cheng-Hsiung;Lee Chung-Ju;Shieh Ming-Feng;Liu Ru-Gun;Shue Shau-Lin;Bao Tien-I
分类号 H01L21/308;H01L21/768;H01L21/306;H01L21/027;H01L21/311 主分类号 H01L21/308
代理机构 代理人
主权项 1. A method of forming a target pattern for an integrated circuit, the method comprising: providing a patterned first spacer layer over a substrate; forming a second spacer layer over the substrate, over the patterned first spacer layer, and onto sidewalls of the patterned first spacer layer; and forming a patterned material layer over the second spacer layer with a second mask, whereby the patterned material layer and the second spacer layer collectively define a plurality of trenches, and wherein the second spacer layer remains formed over the patterned first spacer layer and on the sidewalls of the patterned first spacer layer after the plurality of trenches are defined.
地址 Hsin-Chu TW