发明名称 Contacts for Semiconductor Devices and Methods of Forming Thereof
摘要 A method for a method of forming a semiconductor device includes providing a semiconductor substrate having a bottom surface opposite a top surface with circuitry disposed at the top surface. The method further includes forming a first metal layer having a first metal over the bottom surface of the semiconductor substrate. The first metal layer is formed by depositing an adhesion promoter followed by depositing the first metal.
申请公布号 US2016005647(A1) 申请公布日期 2016.01.07
申请号 US201414324890 申请日期 2014.07.07
申请人 Infineon Technologies AG 发明人 Harrison Mark James;Sporn Martin
分类号 H01L21/768;H01L23/532;H01L21/285 主分类号 H01L21/768
代理机构 代理人
主权项 1. A method of forming a semiconductor device, the method comprising: providing a semiconductor substrate having a bottom surface opposite a top surface with circuitry disposed at the top surface; and forming a first metal layer comprising a first metal over the bottom surface of the semiconductor substrate, wherein forming the first metal layer comprising depositing a adhesion promoter followed by depositing the first metal.
地址 Neubiberg DE