发明名称 |
Contacts for Semiconductor Devices and Methods of Forming Thereof |
摘要 |
A method for a method of forming a semiconductor device includes providing a semiconductor substrate having a bottom surface opposite a top surface with circuitry disposed at the top surface. The method further includes forming a first metal layer having a first metal over the bottom surface of the semiconductor substrate. The first metal layer is formed by depositing an adhesion promoter followed by depositing the first metal. |
申请公布号 |
US2016005647(A1) |
申请公布日期 |
2016.01.07 |
申请号 |
US201414324890 |
申请日期 |
2014.07.07 |
申请人 |
Infineon Technologies AG |
发明人 |
Harrison Mark James;Sporn Martin |
分类号 |
H01L21/768;H01L23/532;H01L21/285 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming a semiconductor device, the method comprising:
providing a semiconductor substrate having a bottom surface opposite a top surface with circuitry disposed at the top surface; and forming a first metal layer comprising a first metal over the bottom surface of the semiconductor substrate, wherein forming the first metal layer comprising depositing a adhesion promoter followed by depositing the first metal. |
地址 |
Neubiberg DE |