发明名称 X-RAY BACKSCATTERING SAFETY INSPECTION SYSTEM HAVING DISTRIBUTED X-RAY SOURCE AND METHOD USING THE SAME
摘要 The present invention provides an X-ray backscattering safety inspection system, comprising: an X-ray source comprising a plurality of target spots each individually controllable to emit X-rays; collimators configured to be respectively passed through the X-ray emitted from the plurality of target spots and output N pencil-shaped X-ray beams, and the N pencil-shaped X-ray beams are irradiated onto N locations of an object to be inspected; and N detectors configured to respectively receive scattering signals from the corresponding locations of the object to be inspected, in which N is a positive integer that is great than or equal to 2. The system may achieve double scannings in one scanning operation, which not only increases scanning speed but also enhances backscattering signal for imaging.
申请公布号 US2016003965(A1) 申请公布日期 2016.01.07
申请号 US201514790880 申请日期 2015.07.02
申请人 TSINGHUA UNIVERSITY ;NUCTECH COMPANY LIMITED 发明人 Chen Zhiqiang;Zhao Ziran;Wu Wanlong;Jin Yingkang;Tang Le;Xu Chengcong;Ruan Ming;Ding Guangwei;Wen Yanjie
分类号 G01V5/00;G01N23/203 主分类号 G01V5/00
代理机构 代理人
主权项 1. An X-ray backscattering safety inspection system, comprising: an X-ray source comprising a plurality of target spots each individually controllable to emit X-rays; collimators configured to be respectively passed through the X-ray emitted from the plurality of target spots and output N pencil-shaped X-ray beams, and the N pencil-shaped X-ray beams are irradiated onto N locations of an object to be inspected; and N detectors configured to respectively receive scattering signals from the corresponding locations of the object to be inspected, in which N is a positive integer that is great than or equal to 2.
地址 Beijing CN
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