| 摘要 |
The present invention relates to a monitoring circuit of a semiconductor device, which is a technology for easily analyzing a defection in a semiconductor device. According to the present invention, the monitoring circuit comprises: a boot-up control unit for generating a boot-up enable signal corresponding to a power-up signal and a boot-up command signal; a read period generating unit for outputting a read period signal corresponding to a boot-up read signal; and a monitoring unit for outputting a read period signal to an output end in the outside when the boot-up enable signal is activated, and monitoring the same. |
