| 摘要 |
An active pixel sensor imaging system (100) comprising: a plurality of active pixel sensor circuits (P) arranged into an array of rows and columns, each active pixel sensor being connected to a supply line (SL) and a column line (CL) and operable to generate a voltage output (VCL) through the column line (CL) corresponding to a detected light intensity; a current sensing circuit (CS1), located external to the plurality of active pixel sensor circuits (P) and connected to the supply line (SL), the current sensing circuit being implemented as current mirror for sensing a current through an active pixel sensor circuit readout transistor (M1); and a feedback circuit (FC1), located external to the plurality of active pixel sensor circuits (P) and connected to the column line (CL), to a current generator (IS) and to the current sensing circuit (CS1), the feedback circuit being implemented as a classAB current mirror configured for controlled quiescent current. And a device comprising an active pixel sensor imaging system according to the present description. |
