发明名称 |
NAND string containing self-aligned control gate sidewall cladding |
摘要 |
A method of making a NAND string includes forming a tunnel dielectric over a semiconductor channel, forming a charge storage layer over the tunnel dielectric, forming a blocking dielectric over the charge storage layer, and forming a control gate layer over the blocking dielectric. The method also includes patterning the control gate layer to form a plurality of control gates separated by trenches, and reacting a first material with exposed sidewalls of the plurality of control gates to form self aligned metal-first material compound sidewall spacers on the exposed sidewalls of the plurality of control gates. |
申请公布号 |
US9230971(B2) |
申请公布日期 |
2016.01.05 |
申请号 |
US201514607339 |
申请日期 |
2015.01.28 |
申请人 |
SANDISK TECHNOLOGIES INC. |
发明人 |
Lee Donovan;Purayath Vinod;Kai James;Matamis George |
分类号 |
H01L29/423;H01L27/115;H01L21/28 |
主分类号 |
H01L29/423 |
代理机构 |
The Marbury Law Group PLLC |
代理人 |
The Marbury Law Group PLLC |
主权项 |
1. A NAND string, comprising:
a semiconductor channel; a tunnel dielectric located over a semiconductor channel; a plurality of floating gates separated by trenches located over the tunnel dielectric; a plurality of blocking dielectric regions separated by the trenches, each of the plurality of blocking dielectric regions is located over at least a respective one of the plurality of floating gates; a plurality of control gates separated by the trenches, each of the plurality of control gates is located over a respective one of the plurality of blocking dielectric regions; and a plurality of metal-first material compound sidewall spacers located on sidewalls of the plurality of control gates; wherein: the sidewall spacers protrude into the trenches beyond sidewalls of respective floating gates located under the control gates; each control gate comprises a first sidewall spacer on a first control gate sidewall and a second sidewall spacer on a second control gate sidewall; a width of each control gate comprises a distance from the first control gate sidewall to the second control gate sidewall; each floating gate comprises a first floating gate sidewall exposed in a first trench and a second floating gate sidewall exposed in a second trench; a width of each control gate comprises a distance from the first floating gate sidewall to the second floating gate sidewall; and the width of each floating gate is greater than the width of each respective control gate located above the respective floating gate. |
地址 |
Plano TX US |