发明名称 Wafer grounding using localized plasma source
摘要 An apparatus may include a substrate support portion, a plasma generation chamber, electrodes, and a power source. The substrate support portion supports a substrate including an insulating layer and a substrate bulk. The plasma generation chamber may include chamber wall portions, a gas port, and a plasma application aperture and is configured to contain a gas. The plasma application aperture may be covered by a portion of the substrate. Each electrode may protrude into or extend into an interior portion of the plasma generation chamber. The power source may be coupled to a particular electrode, and the power source may be configured to apply a voltage to the particular electrode. Application of the voltage to the particular electrode generates a plasma within the plasma generation chamber, whereby generation of the plasma results in a conductive path through the insulating layer of the substrate between the plasma and the substrate bulk.
申请公布号 US9232626(B2) 申请公布日期 2016.01.05
申请号 US201414527301 申请日期 2014.10.29
申请人 KLA-Tencor Corporation 发明人 Sears Christopher
分类号 H01J7/24;H05B31/26;H05H1/46;H01L21/683;H05H1/48;H01J37/32 主分类号 H01J7/24
代理机构 Suiter Swantz pc llo 代理人 Suiter Swantz pc llo
主权项 1. An apparatus, comprising: a substrate support portion configured to support a substrate including at least one insulating layer and a substrate bulk; a plasma generation chamber, the plasma generation chamber being comprised of chamber wall portions, at least one gas port, and a plasma application aperture, wherein the plasma application aperture is covered by a portion of the substrate upon a deposition of the substrate on the substrate support portion, wherein the plasma generation chamber is configured to contain a gas; at least two electrodes including a first electrode and a second electrode, each of the at least two electrodes protruding into or extending into an interior portion of the plasma generation chamber; and at least one power source including at least a first power source, the first power source being coupled to a particular electrode of the at least two electrodes, the first power source being configured to apply a voltage to the particular electrode of the at least two electrodes, wherein application of the voltage to the particular electrode generates a plasma within the plasma generation chamber, whereby generation of the plasma results in a conductive path through the insulating layer of the substrate between the plasma and the substrate bulk.
地址 Milpitas CA US