发明名称 Test solution for a random number generator
摘要 A random number generator and method for testing the same are described. In one embodiment, the random number generator comprises one or more ring oscillator structures, each of the one or more ring oscillator structures having a ring oscillator for use in generating random numbers and having a test structure to reconfigure the ring oscillator into a testable structure.
申请公布号 US9231567(B2) 申请公布日期 2016.01.05
申请号 US201414193932 申请日期 2014.02.28
申请人 Lattice Semiconductor Corporation 发明人 Sul Chinsong;Kwon Hyukyong;Ng Andy
分类号 H03B29/00;H03K3/03;G06F7/58 主分类号 H03B29/00
代理机构 Fenwick & West LLP 代理人 Fenwick & West LLP
主权项 1. A random number generator comprising: two or more ring oscillator structures, each of the ring oscillator structures having an output connected through a network of logic gates and storage cells for random number generation, each of the ring oscillator structures configured to operate in a functional mode and a test mode, each of the ring oscillator structures comprising: a ring oscillator configured to generate random numbers, the ring oscillator comprising a feedback path between an output of an inverter chain of the ring oscillator and an input of the inverter chain of the ring oscillator, anda test structure to reconfigure the ring oscillator structure into a testable structure for testing the ring oscillator structure and the network of logic gates and storage cells in the test mode by changing the feedback path of the ring oscillator, the testable structure comprising a test access port configured to provide access for performing a structural test and a functional test, the structural test performed to identify a fault location in the random number generator, the functional test performed to check functionality of the random number generator.
地址 Portland OR US