发明名称 |
Semiconductor device and method for forming the same |
摘要 |
A semiconductor device in which a gettering layer is formed in a semiconductor substrate, and a method for forming the same are disclosed, resulting in increased reliability of the semiconductor substrate including the gettering layer. The semiconductor device includes a semiconductor substrate; a gettering layer formed of a first-type impurity and a second-type impurity in the semiconductor substrate so as to perform gettering of metal ion; and a deep-well region formed over the gettering layer in the semiconductor substrate. |
申请公布号 |
US9231065(B2) |
申请公布日期 |
2016.01.05 |
申请号 |
US201514677923 |
申请日期 |
2015.04.02 |
申请人 |
SK HYNIX INC. |
发明人 |
Kim Jae Bum |
分类号 |
H01L29/227;H01L21/322;H01L29/36;H01L29/06;H01L21/265;H01L21/8238 |
主分类号 |
H01L29/227 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a first well provided at a first level; and a gettering layer provided at a second level and including a first doping layer and a second doping layer, wherein the second doping layer comprises a polarity opposite to a polarity of the first doping layer, the second level being deeper than the first level, wherein the first doping layer and the second doping layer overlap at least partially. |
地址 |
Icheon KR |