发明名称 Trench-gate-type insulated gate bipolar transistor
摘要 In a trench-gate-type insulated gate bipolar transistor, a current will not flow down to a lower portion of a trench, a high electrical field at the lower portion of the trench is suppressed even if a high voltage is applied, such as at a time of turning off, an increase in on-state resistance and a decrease in breakdown resistance and withstand voltage are suppressed. In the semiconductor device, a plurality of trenches is disposed to reach a rear surface of a drift layer, and a collector layer is disposed at a tip end side in an extended direction of the trenches in a surface layer portion of the drift layer. When a gate electrode is applied with a predetermined voltage, a channel region is formed in a portion of the base layer contacting the trenches, and an electric current flows in the predetermined direction along the trenches.
申请公布号 US9231090(B2) 申请公布日期 2016.01.05
申请号 US201314375895 申请日期 2013.02.18
申请人 DENSO CORPORATION 发明人 Higuchi Yasushi;Sumitomo Masakiyo
分类号 H01L29/739;H01L29/08;H01L29/10;H01L29/423 主分类号 H01L29/739
代理机构 Posz Law Group, PLC 代理人 Posz Law Group, PLC
主权项 1. A semiconductor device comprising: a semiconductor layer providing a first conductivity-type drift layer; a second conductivity-type base layer disposed at least in a surface layer portion of the drift layer adjacent to a front surface of the drift layer; a plurality of trenches extended in a predetermined direction from the base layer to the drift layer; a gate insulation film disposed on a wall surface of each of the plurality of trenches; a gate electrode disposed on the gate insulation film; a first conductivity-type emitter layer disposed in a surface layer portion of the base layer and at side portions of the plurality of trenches; a second conductivity-type collector layer disposed in the surface layer portion of the drift layer and separated from the base layer; an emitter electrode electrically connected to the emitter layer and the base layer; and a collector electrode electrically connected to the collector layer, wherein the trenches are disposed to reach a rear surface of the drift layer, the collector layer is disposed at a tip end side in an extended direction of the trenches in the surface layer portion of the drift layer, and when the gate electrode is applied with a predetermined voltage, a channel region is formed in a portion of the base layer contacting the trenches and an electric current flows in the predetermined direction along the trenches.
地址 Kariya JP