| 发明名称 | Method and system for automated device testing | ||
| 摘要 | Embodiments described herein provide enhanced testing of devices. For example, in an embodiment, an interposer for testing devices is provided. The interposer includes a substrate, a first plurality of connection elements located on a surface of the substrate, and a memory device electrically coupled to the first plurality of connection elements through the substrate. The first plurality of connection elements are configured to mate with a second plurality of connection elements located on a device under test. The memory device is configured to store information received from the device under test and to output stored information to the device under test. | ||
| 申请公布号 | US9230682(B2) | 申请公布日期 | 2016.01.05 |
| 申请号 | US201213727036 | 申请日期 | 2012.12.26 |
| 申请人 | Broadcom Corporation | 发明人 | Mirican Baruyr;Tolman Tyler;Brueggeman Jeffrey |
| 分类号 | G11C7/00;G11C29/02;G11C29/14;G11C29/56 | 主分类号 | G11C7/00 |
| 代理机构 | Sterne, Kessler, Goldstein & Fox P.L.L.C. | 代理人 | Sterne, Kessler, Goldstein & Fox P.L.L.C. |
| 主权项 | 1. An interposer for testing devices, comprising: a substrate; a first plurality of connection elements located on a surface of the substrate; and a memory device electrically coupled to the first plurality of connection elements through the substrate, wherein the first plurality of connection elements is configured to mate with a second plurality of connection elements located on a device under test, wherein the memory device is configured to store information received from the device under test and to output stored information to the device under test, and wherein the memory device is embedded within the substrate. | ||
| 地址 | Irvine CA US | ||