发明名称 Capacitive micro-machined transducer and method of manufacturing the same
摘要 The present invention relates to a method of manufacturing a capacitive micro-machined transducer (100), in particular a CMUT, the method comprising depositing a first electrode layer (10) on a substrate (1), depositing a first dielectric film (20) on the first electrode layer (10), depositing a sacrificial layer (30) on the first dielectric film (20), the sacrificial layer (30) being removable for forming a cavity (35) of the transducer, depositing a second dielectric film (40) on the sacrificial layer (30), and depositing a second electrode layer (50) on the second dielectric film (40), wherein the first dielectric film (20) and/or the second dielectric film (40) comprises a first layer comprising an oxide, a second layer comprising a high-k material, and a third layer comprising an oxide, and wherein the depositing steps are performed by Atomic Layer Deposition. The present invention further relates to a capacitive micro-machined transducer (100), in particular a CMUT, manufactured by such method.
申请公布号 US9231496(B2) 申请公布日期 2016.01.05
申请号 US201314369341 申请日期 2013.01.18
申请人 Koninklijke Philips N.V. 发明人 Dirksen Peter;Mauczok Ruediger;Karakaya Koray;Klootwijk Johan Hendrik;Marcelis Bout;Mulder Marcel
分类号 H02N1/00;B06B1/02;B81C1/00;B81B3/00;H02N1/08 主分类号 H02N1/00
代理机构 代理人
主权项 1. A method of manufacturing a capacitive micro-machined transducer (CMUT), the method comprising: depositing a first electrode layer on a substrate, depositing a first dielectric film on the first electrode layer, depositing a sacrificial layer on the first dielectric film, the sacrificial layer being removable for forming a cavity of the transducer, depositing a second dielectric film on the sacrificial layer, and depositing a second electrode layer on the second dielectric film, wherein the first dielectric film and/or the second dielectric film comprises a first layer comprising an oxide, a second layer comprising a high-k material having a dielectric constant equal to 8 or more, and a third layer comprising an oxide, and wherein the second layer is sandwiched between the first and the third layer and the depositing steps are performed by Atomic Layer Deposition.
地址 Eindhoven NL